Portable Integrity-Scanning Force Microscope

The portable I-SFM (Integrity-Scanning Force Microscope) has been developed for early stage damage detection such as creep cavitation (especially in P91 & P92 steels) which will not be found using traditional replication techniques.

Plant engineers will no longer be required to machine out small pieces of material from thick section components for study in the lab under an SEM (Scanning Electron Microscope) - I-SFM is portable, so it is taken and used directly on components on-site during outages. I-SFM connects to a laptop while operating so that the information it detects is instantly available and can be recorded and manipulated by the user on-site, or can be instantaneously sent in electronic format for analysis. 

I-SFM truly represents the cutting edge in damage detection.

For more detailed product information please click on the brochure image.

Click here to access any of ETD's downloadable service brochures, including I-SFM.

For further information or sales enquiries please contact us.